Automated Steel Cleanliness Analysis Tool (ASCAT)
- ASCAT uses Computer-Controlled Scanning Electron Microscopy (CCSEM) to automate the identification and characterization of inclusions in steel trapped during solidification. It can be fully customized by application.
Chemistry
Full Wet Lab- Certified Class 4 Cleanroom
- LECO CHN,S Chemical Analysis
- Mercury Analysis
- Ion Chromatography
- Auto-Titration
- Electrochemistry/ Corrosion
- Total Organic and Elemental Carbon Analysis (OC-EC)
- Toxicity Characteristic leaching Procedure (TCLP)
- High Performance liquid Chromatography (HPLC)
- Gas Chromatography (GC)
- Flame Ionization Detection (FID)
- Electron Capture Detection (ECD)
- Thermal Conductivity Detection (TCD)
- Solid Phase Microextraction (SPME)
Computer-Controlled Scanning Electron Microscopy (CCSEM)
- CCSEM is an automated analytical technique that combines a scanning electron microscope (SEM), an x-ray analyzer (EDS), and a software-controlled digital scan to quickly locate, size, and characterize large numbers of individual particles and group them based on their elemental composition and shape. This technique is used in the automated analysis of gunshot residue (GSR) particles as well as many other analytical applications, and it can be customized for a specific application.
Construction Materials
Petrography- Air Void Analysis
- Freeze-Thaw Analysis
Metallography and Materials
- Sample Preparation - Mounting, Grinding,
- Polishing, Vibratory Polishing
- Heavy Liquid Separation (HLS)
- Microtomy Thin Sectioning
- Vacuum Filtration
- Electrochemical Etching
- Micro Hardness Tests: Vickers and Rockwell
- Polymer Hardness: Shore A and B
Microscopy
Digital Optical Microscopy- Polarized Light Microscopy (PLM)
- Phase Contrast Microscopy (PCM)
- Scanning Electron Microscopy (SEM)
- Energy Dispersive X-Ray Spectroscopy (EDS)
- Automated SEM-EDS (IntelliSEM)
- Transmission Electron Microscopy (TEM)
- Scanning Transmission Electron Microscopy (STEM)
- Electron Backscatter Diffraction Microscopy (EBSD)
Particle Sizing, Density
- Gas Pycnometry
- Brunauer-Emmett-Teler Method (BET)
- Dynamic light Scattering (DLS)
Spectrometry
- Liquid Chromatography Tandem Mass Spectrometry (LC-MS/MS)
- Liquid Chromatography Time of Flight Mass Spectrometry (LC-TOF-MS)
- Proton Transfer Reaction Mass Spectrometry (PTR-MS)
- Inductively Coupled Plasma Mass Spectrometry (ICP-MS)
- Gas Chromatography/ Mass Spectrometry (GCMS)
Spectroscopy
- Fourier Transform Infrared (FTIR)
- Raman
- Ultraviolet - Visible Light (UV-VIS)
- Inductively Coupled Plasma Optical Emission Spectroscopy (ICP-OES)
Thermochemistry
Thermogravimetric Analysis (TGA)- Residual Gas Analysis (RGA) via PTR-MS
- Differential Scanning Calorimetry (DSC)
- Simultaneous TGA/DSC
X·Ray
- X-Ray Fluorescence (XRF)
- Portable X-Ray Fluorescence (XRF)
- X-Ray Diffraction (XRD) - Wide Angle XRD
- X-Ray Diffraction (XRD) - Rietveld Refinement