Scanning Electron Microscopy (SEM) is a powerful imaging technique that enables the examination of surfaces and materials at extremely high magnification. SEM uses a focused beam of electrons to create detailed images, revealing features and structures that are invisible to the naked eye. This technology enables the identification of contamination, analysis of failure points, and investigation of material composition with remarkable clarity. At RJ Lee Group, SEM is crucial for supporting quality control, troubleshooting, and research across various industries, including manufacturing, pharmaceuticals, electronics, and construction.
Instrumentation
Scanning Electron Microscopy (SEM)
SEM images provide insights into shape, size, and surface details.
What is SEM?
A scanning electron microscope (SEM) operates by directing a focused beam of high-energy electrons onto the surface of a sample and detecting the various signals emitted as the electrons interact with the material. These interactions produce secondary electrons, backscattered electrons, and characteristic X-rays, each offering different insights into the sample’s topography and composition.
The SEM image reveals surface features at nanometer-scale resolution, allowing for precise analysis of morphology, texture, and elemental distribution. SEM is widely used in materials science, biology, and forensic investigations due to its ability to deliver both qualitative and quantitative data with exceptional clarity.
What is CCSEM?
Computer-Controlled Scanning Electron Microscopy (CCSEM) combines the resolution of the SEM with the efficiency of computer automation. IntelliSEM™ software, developed by RJ Lee Group, automates the process of scanning a sample and identifying particles, categorizing shapes, finding inclusions, or other preset criteria for later analysis.
What Can You Do With SEM?
Scanning electron microscopy (SEM) is widely used for high-resolution imaging and surface characterization across many industries:
- Materials Science: Analyze microstructures, grain boundaries, and fracture surfaces to understand mechanical properties and failure mechanisms.
- Pharmaceuticals: Examine particle size, morphology, and coating uniformity in drug formulations to ensure consistency and quality.
- Polymers and Plastics: Investigate filler dispersion, surface defects, and degradation patterns to optimize performance and troubleshoot failures.
- Environmental Testing: Characterize airborne particulates, microplastics, and mineral content in soil or sediment samples.
- Electronics and Semiconductors: Inspect circuit features, solder joints, and contamination at the microscale to support quality control and reliability.
- Forensics: Identify trace evidence such as gunshot residue, fibers, or tool marks to support criminal investigations.
Investigate wear on the surfaces of medical implants.
Inspect microcircuitry for defects.
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Why Choose RJ Lee Group for SEM Analysis?
At RJ Lee Group, we don’t just perform Scanning Electron Microscopy (SEM), we redefine its potential. With over 35 years of experience in materials characterization and scientific consulting, our team brings unmatched expertise, innovation, and precision to every SEM analysis
- Pioneers in SEM Innovation
RJ Lee Group commercialized the first computer-automated SEM. This legacy of innovation continues today with our proprietary IntelliSEM® software. - Advanced Capabilities for Complex Challenges
Our SEM services are designed to deliver actionable insights. We combine SEM with complementary techniques like EDS, XRD, FTIR, and thermal analysis to provide a full-spectrum understanding of your materials. - Trusted by Industry Leaders
Our work has supported Fortune 500 OEMs in extending jet engine life, helped uncover the root causes of infrastructure failures, and contributed to cutting-edge research aboard the International Space Station. - Data-Driven, Decision-Ready
Our SEM analyses are backed by SEAMS, a proprietary big data platform that integrates structured and unstructured data to support real-time decision-making in next-generation manufacturing.
The Dr. Richard J Lee
Microscopy Center of Excellence
Established in 2021, the Richard J Lee Microscopy Center brings together the bulk of our SEM instruments into a single location, giving our experts easy access to a variety of capabilities and fostering collaboration. Combined with SEM capabilities in our powdered materials lab, CBAL lab, and mobile labs, RJ Lee Group boasts one of the largest collections of scanning electron microscopes in the United States. Our capabilities include:
- TESCAN Vega II - High-resolution imaging, elemental analysis
- TESCAN Vega III - Superior imaging quality, fast quantitative elemental results
- TESCAN Miro 3XMH - Extra-large chamber for large sample accommodation
- Jeol JSM 6460LV - Low vacuum capabilities for non-conductive samples
- Thermo Scientific Apreo 2C -
- Hitachi S5500 -
Get in Touch
Contact RJ Lee Group today to learn how our expert FTIR testing can support your material composition analysis needs. Our advanced FTIR capabilities allow us to identify organic and inorganic compounds, detect contaminants, and verify material integrity across a wide range of industries.
Whether you're in manufacturing, environmental science, or research and development, our FTIR analysis—combined with elemental analysis and non-destructive testing—delivers accurate, reliable results tailored to your specific challenges.
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