Peter Zemek 2 min read
PICs/PIDs and RJ Lee Group Advanced Instrumentation Group
Contributors
Peter Zemek
With over 38 years of experience in environmental, industrial, and process engineering, Dr. Peter Zemek is a recognized leader in emerging contaminant technologies, including PFAS detection and carbon capture. A patent-holding scientist and strategic executive, Peter has led global initiatives in air, soil, and groundwater monitoring, developed cutting-edge spectrometry platforms, and spearheaded regulatory innovations. His work spans technical leadership, M&A strategy, and international client engagement, with successful deployments in over a dozen countries. At RJ Lee Group, he drives innovation in VOC testing, litigation support, and advanced analytical services, helping clients navigate complex compliance landscapes with science-backed solutions.
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Are you certain you know what’s in your process stream and emissions—at the ppt level?
Across semiconductor manufacturing, incineration/thermal treatment, fluoropolymer manufacturing, and chemical processing, even well-controlled systems can generate trace-level “unknown unknowns”—including PIDs (Products of Incomplete Destruction) and PICs (Products of Incomplete Combustion) that contribute to:
- Formation of Hazardous Air Pollutants (HAPs)
- Reduced destruction efficiency/incomplete conversion pathways
- Corrosion, fouling, and off-spec production impacts
- Potential generation and/or release of volatile PFAS and PFAS precursor compounds
- Regulatory and reputational risks due to compounds not captured by conventional monitoring
When you need to validate performance, optimize operations, or diagnose a process upset, waiting weeks for lab data is not an option.
RJ Lee Group = Forensics
We provide forensic chemical intelligence through advanced mobile laboratories available on a subcontract basis, equipped with:
- PTR-TOF-MS (Proton Transfer Reaction – Time-of-Flight Mass Spectrometry)
- AIMS (Aerosol Ionization Mass Spectrometry)
- OE-FTIR (Advanced Fourier Transform Infrared Spectrometry)
- OES (Optical Emissions Spectrometry)
- CRDS (Cavity Ringdown Spectrometry)
- XRF/XRD (X-ray Fluorescence and Diffraction)
- SEM/TEM (Tunneling and Scanning Electron Microscopy)
Our platforms offers:
- Near real-time chemical fingerprinting
- Rapid detection and differentiation of process signature
- High-resolution identification of unknown byproduct chemistries
- Ultra-trace sensitivity down to the part-per-trillion (ppt) level
- The ability to identify emerging compounds, intermediates, and precursors driving risk
This is not just monitoring—it’s process forensics: identifying what’s forming, when it’s forming, and what operational conditions are driving it.
Call RJ Lee Group to bring mobile PTR-TOF-MS and AIMS forensics capability to your facility—fast, defensible, and actionable.



